Abstract
Zn–Mn–O semiconductor crystallites with nominal manganese concentration x = 0.01 , 0.04 and 0.10 were synthesized by a solid state reaction method using oxalate precursors. A sintering procedure was carried out in air at 500 and 900 ∘C. The samples were investigated by X-ray diffraction, magnetization measurements and electron paramagnetic resonance. X-ray diffraction spectra reveal that the dominant crystal phase in the Zn–Mn–O system corresponds to the wurtzite structure of ZnO. Room temperature ferromagnetism is observed in Zn–Mn–O samples with manganese concentrations x = 0.01 and 0.04 sintered at low temperature (500 ∘C). Saturation magnetization in the x = 0.01 sample is found to be 0.03 μ B / Mn at T = 300 K . The ferromagnetic phase seems to be developed by Zn diffusion into Mn-oxide grains.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.