Abstract
Accelerated reliability tests of blue phosphorescent organic light-emitting diodes (OLEDs) comprising bis[(4,6-difluorophenyl)pyridinato-N,C2](picolinato)-iridium(III) (FIrpic) doped in four different wide bandgap hosts were conducted. The half-life of the OLEDs stressed under a high current density of 100 mA/cm2 varied in a wide range, revealing an important role of the host. Pulsed current stressing with a 1% duty cycle was performed to suppress self-heating, but only extended the lifetime by 2–3.2×. For blue OLEDs with a host favoring hole transport, current stressing caused a shift of the recombination zone toward the anode, turning the emission color to greenish blue. These results suggest that device degradation was mainly caused by charge-trapping defects generated within a narrow zone close to the electron-transport layer. It is expected that the lifetime of blue phosphorescent OLEDs can be effectively extended by selecting an appropriate host which has good stability, enables efficient charge injection and balanced charge transport in the emissive layer.
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