Role of the different chemical components in the conditioning process of air exposed copper surfaces

Abstract

As a source of heat load on cryogenic sections, the electron cloud is currently a major limitation to the intensity of some modern particle accelerators such as the LHC and its high luminosity upgrade at CERN. During LHC operation, conditioning of the copper beam pipe surface occurs, leading to a decrease of the cloud intensity. To understand the role of the different chemical surface components of air exposed copper in the electron conditioning process, air exposed copper samples as well as specific model surfaces produced in the laboratory, namely sputter-cleaned copper and carbon-free cuprous oxide (${\mathrm{Cu}}_{2}\mathrm{O}$), were conditioned by low energy electron irradiation. Conditioning of air exposed copper results in a decrease of the maximum secondary electron yield (SEY) below 1.1. Surface cleaning by electron stimulated desorption and carbon graphitization without increase of the carbon surface concentration are observed by x-ray photoelectron spectroscopy. After conditioning, the maximum SEY of both sputter-cleaned copper and ${\mathrm{Cu}}_{2}\mathrm{O}$ remains higher than 1.1. No significant surface modification is observed by x-ray photoelectron spectroscopy during irradiation for these two surfaces. These results prove that neither an increase of the amount of surface carbon nor oxide modification is responsible for the SEY reduction observed during electron irradiation of air exposed copper. They confirm that graphitic carbon is required to decrease the maximum SEY of copper below 1.1.