Abstract
In this work we have reported the role of surface roughness potential (SRP) on scattering rate of double layer graphene structure (DLGS) in presence of different dielectric environment, interlayer distance and temperature. We have also compared it with the scattering contribution from charged impurity (CI). In our scattering rate calculation, temperature dependent screening effect is incorporated using the random phase approximation (RPA) model. The scattering due to SRP depends on height of ripples and therefore eventually, the impurity concentration and temperature. The temperature also plays an important role in screening of the SRP. The SRP has proved to be an important factor in the low Coulomb impurity regime, while in high impurity samples SRP can be neglected. We found that above room temperature, the scattering due to SRP decreases gradually. Dielectric constant and thickness of spacer material contribute decisively to total scattering rate of DLGS.
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