Abstract

The role of strain rate ( $${{\dot \varepsilon }}$$ ) in the strain-induced crystallization (SIC) of vulcanized natural rubber (NR) and synthetic isoprene rubber (IR) was studied using in situ wide-angle X-ray scattering (WAXS) (synchrotron X-ray radiation). We developed homemade extension equipment and coupled it with the synchronized time-resolved X-ray detector system. The nucleation rate (I) was determined for a wide range of $${{\dot \varepsilon }}$$ values (0.0075 s−1–330 s−1) based on the increase in the scattering intensity (IX) as a function of time (t). We found that I is proportional to $${\dot{\varepsilon }}$$ ( $$I \propto \dot \varepsilon$$ ). Based on this result, we concluded that $$\dot \varepsilon$$ plays an important role in the kinetic mechanism of the SIC of NR and IR. The role of strain rate ( $$\dot \varepsilon$$ ) in strain induced crystallization (SIC) of vulcanized natural rubber (NR) and synthetic isoprene rubber (IR) was studied by in-situ wide angle X-ray scattering (WAXS). The nucleation rate (I) was determined by measuring the slope on the plot of the scattering intensity (IX) as a function of time (t). Various I values were determined for various $$\dot \varepsilon$$ . On the plot of I vs. $$\dot \varepsilon$$ , we found that I is proportional to $$\dot \varepsilon$$ ; I ∝ $$\dot \varepsilon$$ .

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