Abstract
The electron field emission properties of sulfur-incorporated nanocomposite carbon thin films grown by hot-filament chemical vapor deposition were investigated as a function of film microstructure. The in-plane correlation length (La) of the sp2 C clusters in these films was determined from the intensity ratio of the D and G bands [I(D)/I(G)] in the visible Raman spectra using a phenomenological model. The turn-on field was found to decrease with increasing sp2 C cluster size in the range of 0.8–1.4 nm. The lowest turn-on field found was 4.0 V/μm corresponding to films having sp2 C clusters of around 1.4 nm and conductivity of 30 Ω−1 cm−1. These findings are discussed in terms of a reduced field emission barrier brought about by the incorporation of sulfur and the need for relatively longer conductive paths capable of withstanding the relatively large emission currents.
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