Abstract
The effect of S-content on the medium-and short-range order structure of Ge20Se80−xSxleft(x=0,15,30 mathrm {at}%right), has been investigated by using high-energy X-ray diffraction. Medium-range order changes, as illustrated by the parameters of the first sharp diffraction peak, were discussed in the light of the microcrystalline model. The short-range order parameters have been obtained by the analysis of the first two peaks in the curve of the total radial distribution function. The current results indicate that S-atoms enter the host network of the stiffness composition (Ge20Se80) as compensation of Se-atoms.
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