Abstract

Tris(2-phenylpyridinato-C2, N] Iridium III, Ir(ppy)3, is experimentally investigated as a novel deposited thin film. Ir(ppy)3 thin films were fabricated by the electron beam evaporator technique. X-ray diffraction (XRD) of Ir(ppy)3 powder is investigated to be polycrystalline with triclinic crystal. XRD pattern of Ir(ppy)3 film and the annealed film is analyzed, and the average of crystallite size slightly increases with thermal annealing from 14 to 40 nm. The linear optical parameters were estimated and found that the annealing effect on lattice dielectric constants, dispersion energy, oscillator energy, and the ratio of carrier concentration to its effective mass. The Urbach energy and optical energy gap are estimated at different thermal annealing. On the other hand, dielectric constants and optical conductivity were estimated and found that the annealing plays a remarkable role in the increasing of their values. The calculated values of third-order susceptibility were increased by thermal annealing. Thus, the thermal annealing can be utilized as a tool to modify the optical properties of Ir(ppy)3 films, which can be used in many important applications such as high capacity communication network.

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