Abstract
Dual-material lattices with tailorable coefficients of thermal expansion have been applied to a wide range of modern engineering systems. As supporting techniques for fabricating dual-material lattices with given coefficients of thermal expansion, the current existing methods for measuring the coefficient of thermal expansion have limited anti-interference ability. They ignore the measuring error caused by micro-displacement between the measurement sensor and the test sample. In this paper, we report a robust interferometric test method which can eliminate the measurement error caused by micro-displacement between the measurement sensor and the test sample. In the presented method, two parallel plane lenses are utilized to avoid the measurement error caused by translation, and the right lens is utilized as an angle detector to eliminate the measurement error caused by rotation. A robust interferometric testing setup was established using a distance measuring set and two plane lenses. The experiment results indicated that the method can avoid the measurement error induced by translation and has the potential to eliminate the measurement error induced by rotation using the rotational angle. This method can improve the anti-interference ability and accuracy by eliminating the measurement error. It is especially useful for high-precision thermal expansion measurement of dual-material lattices.
Highlights
Dual-material lattices with tailorable coefficients of thermal expansion (CTE) have been widely used in many applications [1,2,3]
We reported on a robust interferometric method that can eliminate the measurement error induced by micro-displacement
This method can greatly enhance the anti-interference ability and accuracy by eliminating the measurement error. This method is especially useful for CTE measurement of non-standard samples like dual-material truss structures with high precision requirements
Summary
Dual-material lattices with tailorable coefficients of thermal expansion (CTE) have been widely used in many applications [1,2,3]. We measured the CTE of a dual-material lattice with negative thermal expansion using laser interferometry [17], but the measurement error was large, and we did not consider the measurement error caused by the micro-displacement. It uses a high-resolution camera to capture the digital images of the test sample This method can eliminate part of the measurement error caused by the micro-displacement via data processing. Developing a robust measurement method for testing the CTEs of dual-material lattices which can eliminate the measurement error caused by micro-displacement is still challenging and has never been reported (according to the authors’ knowledge). We report on a robust laser interferometric measurement method for dual-material lattices to overcome the measurement error caused by micro-displacement. The measurement error caused by micro-displacement can be eliminated completely
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