Abstract
Exact measurement of coercivity in thin magnetic films is of high importance for sensor industry. In exchange biased multilayers, incorporated in magnetoresistive sensors, coercivity of the coupled ferromagnetic layers strongly depends on the orientation of easy axis in respect to field. We show, that in NiFe/IrMn films with high HB/HC ratio, field misalignment ∼2° results in ∼50 % change in coercivity. Inhomogeneous magnetic field in a film deposition device as well as manual installation of the sample in magnetometers result in large error in coercivity. In this work, we propose measurement and analysis protocol to avoid this uncertainty and to evaluate easy axis coercivity values from tilted angle measurements in a wide temperature range using just one reference value of easy axis coercive field, measured at room temperature.
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