Abstract

The addition of artificially induced defects improves the pinning efficiency of magnetic flux vortices in YBa2Cu3O7-delta (YBCO) films. In YBCO films by pulsed laser ablation (PLD) technique this goal can be pursued by the introduction of epitaxial second phase nanoinclusions in the YBCO matrix. In the present work, the effect of BaZrO3 (BZO) inclusions in stoichiometric YBCO films on transport properties has been studied. Composite targets obtained by addition of BZO powder in molar percents ranging from 2.5 to 7 mol.% have been prepared with BZO mean grain size of about 1 mum. Structural and morphological characterizations of the films obtained by PLD from these targets have been carried out through X-ray diffractometry and Scanning Electron Microscopy (SEM) analysis. Dc electrical transport measurements at 77 K have revealed a better magnetic field retention of the critical current density, Jc, being at 3 T the 14.6% and the 16.4% of the zero field values for YBCO-BZO 5% and 7%, respectively. The complex surface impedance has been measured by means of a dielectric resonator at a high microwave frequency (50 GHz). In order to identify the potentially strong pinning induced by the inclusions, the field-dependent complex resistivity has been determined as a function of temperature in a moderate magnetic field (B < 1T). Very high depinning frequency are estimated in YBCO films with BZO inclusions indicating extremely high vortex pinning and steep potential wells.

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