Abstract

A combined system was constructed for simultaneous observation of surface tension waves and surface reflectivity, and applied to a Langmuir film of stearic acid. A clear consistency in the experimental results obtained by the ripplon light scattering technique and those by scanning angle reflectometry was demonstrated when the film was in the inhomogeneous state. The same spot on the water surface was illuminated by both probe lasers. The resolution of the ripplon light scattering technique was partly improved with the aid of scanning angle reflectometry. The combined system is available for noncontact and nondestructive characterization of the inhomogeneous surface of liquids.

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