Abstract
Deposition of three dimensional particles on flat single crystalline surface results in appearance of transmission diffraction features. Analysis of diffraction patterns gives a possibility to characterize in situ the particle structure and orientation as well as to determine the variation of lattice parameter during particle growth. We have used the RHEED-system equipped with a data acquisition tool permitting both image processing and real time analysis. Different mode of epitaxy and lattice parameter variations were observed. The RHEED results were correlated with ex situ observations of particle size by means of Transmission Electron Microscopy (TEM).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.