Abstract
Pd/Al bimetallic thin films were grown by molecular beam epitaxy on single-crystalline NaCl (0 0 1) surface. Substrate and deposit crystallographic structures were investigated by reflection high-energy electron diffraction (RHEED). An evolution of the intensity of diffraction spots gave information on the formation of a bimetallic system. The formation of bimetallic alloy in early stages of the growth was studied in dependence on the succession of deposited materials. It was discussed in terms of evolution of the diffraction spot intensity and Pd/Al lattice parameter during the growth. The three-dimensional growth of Pd/Al bimetallic clusters has been observed. The oriented Pd/Al phase exhibited (1 0 0) epitaxial plane parallel to the substrate surface.
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