Abstract
Magnitude and sign of photon induced changes in surface conductance depend on the type of surface oxide which is grown after different surface treatments. The type of surface oxides is investigated by RHEED. The RHEED patterns exhibit independent spot and ring systems respectively. The spots are attributed to monocrystalline InSb. The rings indicate that the surface layers consist of various polycrystalline oxides of the underlying semiconductor depending on the surface treatment. The results of the structural measurements are correlated to the electrical properties of the surfaces as investigated by combined ac field effect.
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