Abstract
SiO 2 -P 2 O 5 -HfO 2 -Al 2 O 3 -Na 2 O planar waveguide was fabricated by rf-sputtering technique. The optical, structural and morphological parameters were measured by various techniques such as m-line spectroscopy, Energy Dispersive X-ray Spectroscopy and Atomic Force Microscopy. The waveguide exhibits a single propagation mode at 1319 and 1542 nm with an attenuation coefficient of 0.2 dB/cm in the infrared. The emission of 4I 13/2 → 4I 15/2 transition of Er3+ ion, with a 28.5 nm bandwidth was observed upon TE0 mode excitation at 514.5 nm. The optical and spectroscopic features of the Er3+-activated parent P 2 O 5 -SiO 2 -Al 2 O 3 -Na 2 O glass were also investigated.
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