Abstract

A prototype RF probe card is assembled to test the feasibility of Pogo-pins as robust probe tips for the automized testing of multiple-port millimeter-wave circuits. A custom-made ceramic housing machined from a low-loss dielectric holds an array of 157 Pogo-pins, each with 2.9 mm-length in fixed positions. The ceramic housing is then mounted onto a probe-card PCB for power-loss measurements on two signal-ground Pogo-pin connections arbitrarily selected from the array. The probing results on a test circuit with a simple thru-line indicate a successful power transfer with a small insertion loss of less than 0.5 dB per single Pogo-pin connection up to 25 GHz. A new probe card design using shorter Pogo-pins is being prepared to extend the operation frequency to beyond 40 GHz.

Highlights

  • Most RF probes typically contain microscopic landing tips attached to the end of a coaxial cable in the form of coplanar waveguide (CPW) transmission lines [1]

  • We present a fully assembled RF probe card that uses an array of 157 Pogo-pins packaged in a low-loss ceramic with the pitch size fixed by the millimeter-wave circuit under testing

  • A ceramic housing that holds an array of 157 pogo-pins is fabricated for the automatic testing of 29/39 GHz on-wafer 5G phased-array system on chips (SoC)

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Summary

Introduction

RF Pogo-Pin. RF probes are critical components in high-frequency on-wafer testing environments. RF probes are critical components in high-frequency on-wafer testing environments They are extensively used to deliver high-frequency signals to two-port integrated circuits that include 50-Ω probe pads. Most RF probes typically contain microscopic landing tips attached to the end of a coaxial cable in the form of coplanar waveguide (CPW) transmission lines [1]. Commercial single-port probes are readily available from manufactures such as Cascades Inc. and GGB Inc. for frequencies reaching up to 1.1 THz. From our internal experiment, a 50-GHz probe from GGB (50A-GSG-100-P) is found to be almost loss-free with the measured insertion loss of less than 0.4 dB at 50 GHz

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