Abstract

This paper presents the concept of applying incremental capacity analysis (ICA) on the OCV curve in the SoC space. The OCV curve can be obtained from any sequence of discharge or charge current or power pulse with a necessary rest period to allow the cell to reach a pseudo-OCV after each pulse. With a high resolution (>100 pulses) in the full SoC window, an OCV-vs.-SoC curve can be obtained with sufficient accuracy to perform an ICA on the obtained OCV curve. ICA as a diagnostic technique has commonly been applied on Li-ion cells with constant charge and discharge at slow currents. However, a slow controlled constant current charge or discharge is normally not feasible and cannot be easily applied to a battery in an application. Here, we revisit pulse-based ICA to supplement the conventional constant-current-based technique. Based on actual ageing data, we show that ICA performed on a selection of high-resolution OCV curves is comparable or better than conventional ICA with constant current. The main advantage of OCV-ICA is that it can be applied to most cells and systems without a significant interruption of normal cell operation. OCV-ICA can provide valuable insights into ageing mechanisms as well as, e.g., detailed information on changes in internal resistance.

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