Abstract
Thru-reflect-line (TRL) calibration method were reviewed and the related kits based on substrate integrated waveguide (SIW) were re-examined, designed, and compared for measurements of SIW circuits. Different types of calibration kits were discussed and the design guidelines were provided. Filters working at 5 and 10 GHz were designed for the verification purpose of these calibration kits. Meanwhile, the TRL calibration method based on uniform SIW-coaxial transitions was proposed, which shows improved measurement accuracy.
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