Review on Investigation of Shear Lag Effect for EMI and PZT Technique by Using Analytical Approach

Abstract

Abstract: The advent of smart materials such as piezoelectric (PZT) sensors has helped to revolutionize the field of structural health monitoring (SHM) based on NDT techniques. Currently, the effect of the thickness of the adhesive layer (Shear lag Effect) is considered insignificant in the practical application of EMI technology. Although a relatively new NDT method known as the electromechanical (EMI) technique has been studied for more than two decades, there are still a number of issues that must be resolved before it can be applied to real structures. A technique with significant potential to advance one of the most efficient SHM systems involves the use of a single PZT to excite and sense the host structure. This article reviews the research related to EMI technology over the past decade to understand its trend. It also compares new concepts and ideas proposed by other authors and ends the work with a discussion of possible directions for future work.