Abstract
Cerium dioxide (CeO2) exhibits complex behavior when irradiated with swift heavy ions. Modifications to this material originate from the production of atomic-scale defects, which accumulate and induce changes to the microstructure, chemistry, and material properties. As such, characterizing its radiation response requires a wide range of complementary characterization techniques to elucidate the defect formation and stability over multiple length scales, such as X-ray and neutron scattering, optical spectroscopy, and electron microscopy. In this article, recent experimental efforts are reviewed in order to holistically assess the current understanding and knowledge gaps regarding the underlying physical mechanisms that dictate the response of CeO2 and related materials to irradiation with swift heavy ions. The recent application of novel experimental techniques has provided additional insight into the structural and chemical behavior of irradiation-induced defects, from the local, atomic-scale arrangement to the long-range structure. However, future work must carefully account for the influence of experimental conditions, with respect to both sample properties (e.g., grain size and impurity content) and ion-beam parameters (e.g., ion mass and energy), to facilitate a more direct comparison of experimental results.
Highlights
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To bridge the gaps between SHI irradiation-induced electronic excitation, atomic displacement, defect production, and bulk material modification, we review here in detail the unique response of CeO2 to swift heavy ion irradiation, as revealed by a wide range of characterization techniques
In situ scattering measurements show how the defect structure recovers at high temperature, while differential scanning calorimetry (DSC) measurements yield the associated energetics of these processes [53]
Summary
And doped group Fm-3m), common to a variety of dioxides such as UO2 , ThO2 PuO2 , and ZrO doped [1,2]. Understanding the intermediate mechanisms by which electronic excitation and the subsequent atomic displacement yield changes to the long-range structure and chemistry of CeO2 is critical to its performance in various engineering applications These processes are complex, multiscale, and difficult to fully characterize. To bridge the gaps between SHI irradiation-induced electronic excitation, atomic displacement, defect production, and bulk material modification, we review here in detail the unique response of CeO2 to swift heavy ion irradiation, as revealed by a wide range of characterization techniques. After initially summarizing the most important characterization techniques, this article first reviews work investigating the fundamental structural and electronic modifications induced by swift heavy ions that lead to the formation of ion tracks in CeO2 This is followed by a description of how these radiation effects are influenced by the irradiation conditions (ion energy, ion stopping power, temperature, and pressure) and sample characteristics (chemical composition and microstructure). The manuscript concludes with a brief comparison of swift heavy ion effects in CeO2 with those in related fluorite-derivative oxides, followed by a summary and outlook
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