Review of Short-circuit Protection Circuits for SiC MOSFETs

Abstract

Silicon carbide (SiC) metal-oxide-semiconductor field effect transistors (MOSFETs) are commonly used in the power transistor industry owing to their superior conductivity, low switching loss, high-frequency operation, and desirable thermal characteristics. However, the short-circuit withstand time of SiC MOSFETs is shorter than that of Si devices, which is disadvantageous in fault states. Gate drivers for SiC MOSFETs require short-circuit protection and soft termination circuits to detect short circuits and protect the power devices and systems from a short-circuit state. Thus, short-circuit protection circuits for SiC MOSFETs are reviewed in this paper. Accordingly, short-circuit detection circuits classified according to gate-source voltage (VGS), drain-source voltage (VDS), and drain-source current (IDS) detection methods are discussed. Moreover, the merits and demerits of soft termination circuits are reviewed.