Abstract
The structures of phase-changeIn0.21Sb0.79 thin film in the amorphous phase were modeled using the reverse Monte Carlo (RMC)method, making simultaneous use of measured x-ray diffraction and x-ray absorption finestructure data. The experimental data that we used do not contain the crystalline phase,which can be observed in the diffraction pattern. Three kinds of initial configurations—asimple cubic lattice, a rhombohedral A7 structure and a dense randomly packed hardsphere form—were used in attempts to reproduce the measured data. The formerconfiguration is thought to be the most probable structure for the crystallineIn0.21Sb0.79 thin film. For the latter configuration we could not reproduce the structure of the amorphousIn0.21Sb0.79 thinfilm under the present RMC conditions. We obtained probable structure models for the amorphousIn0.21Sb0.79 thin film. We found that the models obtained possess some traces of crystallinity.
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