Abstract
Journal of Circuits, Systems and ComputersVol. 22, No. 06, 1393001 (2013) RetractionFree AccessRETRACTION — AUTONOMOUS GROUP TESTING BASED FAULT TOLERANCE IN RECONFIGURABLE LOGIC DEVICESJAVAD SABABEH and KARIM MOHAMMADIJAVAD SABABEHCollege of Electrical Engineering, Iran University of Science and Technology, Narmak, Tehran, Iran and KARIM MOHAMMADICollege of Electrical Engineering, Iran University of Science and Technology, Narmak, Tehran, Iranhttps://doi.org/10.1142/S0218126613930018Cited by:0 Previous AboutSectionsPDF/EPUB ToolsAdd to favoritesDownload CitationsTrack CitationsRecommend to Library ShareShare onFacebookTwitterLinked InRedditEmail [J. Circuits, Syst. Comput., Vol. 19, No. 6 (2010) 1199] DOI: 10.1142/S0218126610006827. FiguresReferencesRelatedDetails Recommended Vol. 22, No. 06 Metrics History Published: 11 July 2013 PDF download
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