RETRACTED: New devices Si-rich and C-rich a-Si1−C thin films gas sensors based

Abstract

This article has been retracted at the request of < This article has been retracted: please see Elsevier Policy on Article Withdrawal ( http://www.elsevier.com/locate/withdrawalpolicy ). This article has been retracted at the request of the Editor-in-Chief. The journal's investigation showed the following: The only really new parts of the article (compared with the earlier Applied Surface Science paper “Si-rich a-Si1-xCx thin films by d.c. magnetron co-sputtering of silicon and silicon carbide: Structural and optical properties” ( http://dx.doi.org/10.1016/j.apsusc.2012.10.129 )) are chapter 3.5 (Gas Sensor Testing) and parts of chapter 4. (Conclusion) Ten out of fifteen figures (1.a,b,c, 2., 3., 4., 5., 6.a,b,c) are completely or at least mainly identical with the earlier Applied Surface Science paper. Major parts of the text up to chapter 3.5 are largely identical with the earlier Applied Surface Science paper. One of the conditions of submission of a paper for publication is that authors declare explicitly that their work is original and has not appeared in a publication elsewhere. As such this article represents an abuse of the scientific publishing system. The scientific community takes a very strong view on this matter and apologies are offered to readers of the journal that this was not detected during the submission process.>.