Abstract
Retracted: Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO<sub>2</sub> Semiconductor
Highlights
Retraction Retracted: Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor
International Journal of Photoenergy has retracted the article titled “Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor” [1], as it is essentially identical in content with a previously published paper [2]
While in the earlier published paper, the figures described the Ru-complex attached to TiO2, the same figures have been used in this article to describe the electron transfer between the Ru-complex and the SnO2 semiconductor
Summary
Retraction Retracted: Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor
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