Abstract
Scintillator is a material that exhibits scintillation when excited by ionizing radiation. Luminescent materials, when struck by an incoming particle, absorb its energy and scintillate. Sometimes, the excited state is metastable, so the relaxation back down from the excited state to lower states is delayed (necessitating anywhere from a few nanoseconds to hours depending on the material). The process then corresponds to either one of two phenomena, depending on the type of transition and hence the wavelength of the emitted optical photon: delayed fluorescence or phosphorescence. On the other hand, study of hard X-ray emission from the energetic electrons is an important issue in tokamaks. Suggestion of methods to reduce these electrons and therefore emitted hard X-ray is important for tokamak plasma operation. In this work, we investigated the effects of external applied fields on hard X-ray intensity and Mirnov activity using the NaI scintillator and fast Fourier transform analysis.
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