Abstract
The following article, which was published online by Taylor & Francis on 4th January 2012, has been retracted from publication in Nondestructive Testing and Evaluation. Ibrahim, A., 2012. Dark current–voltage characteristics and lock-in thermography techniques as diagnostic tools for monocrystalline silicon solar cells after thermal stress. Nondestructive Testing and Evaluation, DOI: 10.1080/10589759.2011.633606.This article has been found to reproduce content to a high degree of similarity, without appropriate attribution or acknowledgement by the author, from the following original article:Ibrahim, A., 2011. Dark Current-Voltage Characteristics and Lock-in Thermography Techniques as Diagnostic Tools for Monocrystalline Silicon Solar Cells. International Journal of Renewable Energy Research, 1(3), 169–174.The journal's policy in this respect is clear: Nondestructive Testing and Evaluation considers all manuscripts on the strict condition that they have been submitted only to Nondestructive Testing and Evaluation, that they have not been published already, nor are they under consideration for publication or in press elsewhere.The article is withdrawn from all electronic editions.
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