Abstract
For many software development organizations it is of crucial importance to reduce development costs while still maintaining high product quality. Since testing commonly constitutes a significant part of the development time, one way to increase efficiency is to find more faults early when they are cheaper to pinpoint and remove. This paper presents empirical results from introducing a concept for early fault detection. That is, an alternative approach to Test-Driven Development which was applied on a component level instead of on a class/method level. The selected method for evaluating the result of introducing the concept was based on an existing method for fault-based process assessment and was proven practically useful for evaluating fault reducing improvements. The evaluation was made on two industrial projects and on different features within a project that only implemented the concept partly. The evaluation result demonstrated improvements regarding decreased fault rates and Return On Investment (ROI), e.g. the total project cost became about 5–6% less already in the first two studied projects.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
