Response to “Comment on ‘Thickness and angular dependencies of exchange bias in ferromagnetic/antiferromagnetic bilayers’ [J. Appl. Phys. 92, 1009 (2002)] and ‘Thickness dependence of exchange bias and coercivity in a ferromagnetic layer coupled with an antiferromagnetic layer’ [J. Appl. Phys. 94, 2529 (2003)

Abstract

The approach of using the generalized Meiklejohn-Bean model to derive the antiferromagnetic thickness dependence of exchange bias and coercivity in ferromagnetic/antiferromagnetic bilayers is justified. The mathematical procedure to obtain the analytical expressions through finding the critical fields is illuminated.