Abstract
Changes in leaf reflectance as water content decreases have been hypothesized to occur in the 1.55-1.75 and 2.08-2.35 micron wavelength regions. To evaluate this hypothesis, studies were conducted on ryegrass (Lolium multiflorum Lam.) and oats (Avena sativa L.), which were grown in a controlled, outdoor situation. Both fully-watered control beds and water-stressed beds were periodically examined with a spectroradiometer calibrated against a reflectance reference of polytetrafluoroethylene. The observed changes correspond to those predicted by stochastic leaf models employed by other investigators (leaf reflection increases in the 1.55-1.75 micron region as leaf water content decreases). Although the percentage changes in TM bands 1-3 are nearly as great as those found in TM bands 5 and 7, the absolute values of reflectance change are much lower. It is believed that these patterns are probably characteristic of a broad range of vegetation types. In terms of phenomena detection, these patterns should be considered in any practical remote sensing sensor scenario.
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