Response of CR-39 track detector to low-energy heavy ion beams

Abstract

The response of a CR-39 track detector to ion beams was examined for the purpose of diagnosing low-energy heavy ion beams. The effect of a low-energy heavy ion beam on the CR-39 track detector is limited to its top surface, which means that a careful and quick treatment is necessary for the chemical etching process of ion-irradiated track detectors. It was found that the optimal etching time almost agreed with that estimated from calculations on the ion range and the V function concerning the track etch rate. The outline of a thin Ar + beam was successfully measured up to about 10 μ m in diameter in the energy range from 20 to 200 keV.