Abstract
Correlated double sampling (CDS) was introduced by White et al. (1974) as a technique for removal of switching transients and elimination of the Nyquist (reset) noise, both of which are associated with charge sensing circuits employed in charge-coupled device arrays. An additional advantage is the attenuation of the 1/f noise component in the charge sensing circuits due to the zero in the CDS noise transfer function at the origin (/spl omega/=0). The effect of the CDS circuit on the reset noise and Johnson-Nyquist (white) noise in the associated circuitry has been adequately described (see ibid., vol.SC-11, no.1, p.147, 1976). The author presents an analysis of the effect of the CDS circuit on the 1/f noise component generated in the preceding CCD circuitry.
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