Abstract
Resonant x-ray reflectivity (XRR) is utilized to characterize the structural properties of La0.7Sr0.3MnO3/La0.7Sr0.3FeO3 superlattices. XRR spectra at the Mn and Fe absorption edges provide additional structural information compared to spectra obtained with a conventional Cu x-ray source. We demonstrate that this technique provides individual layer thicknesses and intermixing behavior of perovskite superlattices with small density contrast in a non-destructive manner. These results are consistent with scanning transmission electron microscopy and electron energy loss spectroscopy.
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