Abstract
We propose and characterize a scattering probe for terahertz (THz) near-field microscopy, fabricated from indium, where the scattering efficiency is enhanced by the dipolar resonance supported by the indium probe. The scattering properties of the probe were evaluated experimentally using THz time-domain spectroscopy (TDS), and numerically using the finite-difference time-domain (FDTD) method in order to identify resonant enhancement. Numerical measurements show that the indium probes exhibit enhanced scattering across the THz frequency range due to dipolar resonance, with a fractional bandwidth of 0.65 at 1.24 THz. We experimentally observe the resonant enhancement of the scattered field with a peak at 0.3 THz. To enable practical THz microscopy applications of these resonant probes, we also demonstrate a simple excitation scheme utilizing a THz source with radial polarization, which excites a radial mode along the length of the tip. Strong field confinement at the apex of the tip, as required for THz near-field microscopy, was observed experimentally.
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