Resonant subgap current transport in Josephson field effect transistor

Abstract

We study theoretically the current-voltage characteristics (IVCs) of the Josephson field effect transistor - a ballistic SNINS junction with superconducting (S) electrodes confining a planar normal metal region (N), which is controlled by the gate induced potential barrier (I). The calculations were performed using the computation technique developed earlier for long single-channel junctions in the coherent multiple Andreev reflections (MAR) regime. We find significant difference of the subgap current structure in these junctions compared to the subharmonic gap structure in tunnel junctions and atomic-size point contacts. For long junctions, whose length significantly exceeds the coherence length, the IVC exhibits current peaks at multiples (harmonics) of the difference $\delta_m$ between the static Andreev levels, $eV_n = n\delta_m$. Moreover, the averaged IVC follows the power rather than exponential behavior, and has a universal scaling with the junction transparency. This result is qualitatively understood using an analytical approach based on the concept of resonant MAR trajectories. In shorter junctions whose length is comparable to the coherence length, the IVC has an exponential form common for point contacts, however the current structures appear at the subharmonics of the Andreev interlevel distance, $eV_n = \delta_m/n$ rather than the gap subharmonics $2\Delta/n$.