Abstract
Resonant secondary emission (RSE) from semiconductor nanostructures consists of an incoherent component (resonant luminescence), and a coherent component (resonant Rayleigh scattering (RRS)) that originates from disorder. Ultrafast spectral interferometry unambiguously isolates this coherent component, and demonstrates the presence of speckles, contrary to earlier expectations. It further allows the investigation of the complex amplitude and phase dynamics of the coherent emission, and provides new insights into the physics ofRRS and disorder. We review recent developments in the field.
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