Abstract
Radiationless resonant electronic excitation transfer from silicon nanocrystals to I 2 molecules sorbed in pores of porous silicon was observed. Energy distribution of desorbed I 2 molecules was investigated by the time-of-flight mass-spectrometry technique and relatively high kinetic energies (1-3 eV) were detected. It was shown that the mechanism of excitation transfer is satisfactorily described by the Forster model.
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