Abstract

We discuss two types of resonant techniques for measuring the electrodynamic properties of conductors in the millimeter and sub-millimeter wave spectral ranges. Using a series of backward wave oscillator sources, we can obtain essentially complete coverage of the frequency range 30 - 1000 GHz. At 100 GHz and below, cylindrical cavity resonators operating the in their TE 011 mode are employed to measure both components of the complex surface impedance of bulk samples. Above approximately 100 GHz, a Fabry-Perot resonator, consisting of a sapphire plate with a conducting sample placed against one side, is used. Both thin film and bulk samples may be measured with this technique. We focus on measurement on thin film samples, where the complex conductivity can be obtained directly from the transmission spectra.

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