Abstract
A new technique is reported for the study of gas amplification fluctuation in proportional counters. Use was made of pulsed laser beams to carry out two-step resonant ionization spectroscopy (RIS) of Cs atoms which were seeded at very low concentration into the counting gas. With this independent determination of the fluctuation of the gas amplification, one can determine the Fano factor which enters into the statistics of the ionization of gases by swift charged particles. Accordingly, RIS measurements were made in P-10 gas (90% Ar+10% CH 4), and the fluctuations in pulse heights were compared with fluctuations observed with X-ray sources to obtain Fano factors. We found, for photoelectrons at 2.6 keV and at 5.9 keV stopping in the counting gas, the Fano factors 0.31±0.10 and 0.21±0.10 respectively.
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