Abstract
The resonant excitation in thin films of bulk plasma waves by incident electromagnetic waves is studied, and is shown to lead to structure in the reflectance, transmittance, and absorptance.Received 22 April 1968DOI:https://doi.org/10.1103/PhysRevLett.21.85©1968 American Physical Society
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have