Abstract

-We have theoretically shown that the yield of diffuse radiation generated by relativistic electrons passing random multilayered systems can be increased when a resonant condition is met. The resonant condition can be satisfied for the wavelength region representing visible light as well as soft X rays. The intensity of diffusive soft X rays for specific multilayered systems consisting of two components is compared with the intensity of Cherenkov radiation. For radiation at a photon energy of 99.4 eV, the intensity of resonant diffusive radiation (RDR) generated by 5-MeV electrons passing a Be/Si multilayer exceeds the intensity of Cherenkov radiation by a factor of ≈60 for electrons with the same energy passing a Si foil. For a photon energy of 453 eV and 13 MeV, electrons passing a Be/Ti multilayer generate RDR exceeding the Cherenkov radiation generated by electrons passing Ti foils by a factor =130.

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