Abstract
The mathematical model of AFM probe subjected to multimode excitation based on the modified couple stress theory is presented. The semianalytical solution of the system is proposed. The transient behavior and response spectrum of AFM probe subjected to multimode excitation are investigated. It is very helpful to predict the nanotopography and surface properties based on the response of multimodes excitation. The effects of the root excitation, size parameter, and interacting distance on the response spectrum and frequency shift are investigated. The resonant frequency relation of the two systems with different size parameters is discovered and expressed in a formula. The natural frequencies predicted via the formula and those determined by the semianalytical method are significantly consistent.
Highlights
IntroductionThe literatures investigated the steady behavior of Atomic force microscopy (AFM) probe [2,3,4,5,6,7,8,9]
Atomic force microscopy (AFM) is a powerful device for scanning the atomic-scale topography and property of a sample’s surface [1].In convention, the literatures investigated the steady behavior of AFM probe [2,3,4,5,6,7,8,9]
The literatures investigated the steady behavior of AFM probe [2,3,4,5,6,7,8,9]
Summary
The literatures investigated the steady behavior of AFM probe [2,3,4,5,6,7,8,9]. The investigation of the amplitude and phase behavior in the transient regime will increase significantly the speed of imaging and accuracy. Sahoo et al [11] increased the speed of imaging and control of AFM by studying the transient motion of cantilever signal. Chang et al [12] presented a new algorithm for high speed AFM imaging of biopolymers by investigating the transition from transient part to steady state regime. Payam [9] studied the transient behavior of tapping mode-AFM in the mass-spring-damper model
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