Abstract
We have examined epitaxial InSb films by Raman scattering for the first time. The films, 0.17–2.67 μm thick, were grown on (100) GaAs substrates by the new technique of metalorganic magnetron sputtering. We observe the first and second order longitudinal optical phonon peaks, the latter enhanced by outgoing resonance with the E1+Δ1 gap of InSb, and an upshift of this gap due to compressive biaxial stress. We also observe an anomalous dependence of stress on film thickness. The Raman data indicate good sample quality despite the large lattice mismatch between InSb and GaAs.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
