Abstract
Many experiments have been proposed for testing resolution in the scanning electron microscope but no standard has been universally accepted.Many investigators have used the smallest separation between two arms of a 50-50% Al-W alloy dendrite as being a measure of resolution but, like other tests, criticism has persisted due to the difference in vertical height between the arms. During the course of our investigations of anodically formed oxides on Zircaloy-2 (a dilute Zr alloy containing 0.05% Ni, 0.1% Fe, 0.1% Cr and 1.5% Sn) a rapid measure of instrument performance was found. The SEM results presented here were obtained on a Coates and Welter CWIKSCAN Model 106A.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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