Abstract
Annealed samples of technically pure silver were pre-twisted and subsequently creep tested in uniaxial tension at room temperature. In the initial stages of creep, it was found that a significant decrease in the electrical resistivity of the pre-twisted samples to a certain minimum value occurs. The magnitude of the resistivity decrease was sensitive to the type and amount of the twist given. The initial decrease in resistivity was followed by its linear increase with further creep time. Impurity segregation to the moving dislocations may be the reason for the observed initial resistivity decrease.
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