Abstract
We report the analytical solution to a problem of voltage and current distribution in a two-cell stack with the small amplitude resistive spot in one of the cells. Voltage disturbance in the defective cell increases almost linearly with the characteristic spot radius. The general expression for voltage loss due to a spot in an N-cell stack is obtained; it is stack current density times peak spot resistivity times square of the characteristic spot radius. Based on the solutions derived, a method for spot detection in a stack is discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
