Resistive Behavior of High Tc Superconducting Thin Film in Magnetic Field

Abstract

We have measured the temperature dependence of resistance for epitaxial and polycrystalline YBCO thin films in a magnetic field. The resistive behavior of the epitaxial thin film could be explained by the flux creep model. The pinning potential estimated from that model had strong anisotoropy and this anisotropy was consistent with that of the coherence length. On the other hand, the resistive behavior of the polycrystalline thin film could not be explained by the flux creep model. It was suggested that the broadening of the resistivity for the polycrystalline thin film is caused by weakly linked grain boundaries.