Resistance of single polyaniline fibers and their junctions measured by double-probe atomic force microscopy

Abstract

Electrical properties of polyaniline (PANI) fibers are of our interest as a component of network materials. Using a multiple-probe atomic force microscope with tuning fork probes, we investigated the resistance of single PANI fibers and their cross-point junction where the fibers contact each other. The resistivity of single PANI fibers was measured to be on the order of 10 Ω cm, and the contact resistance between PANI fibers was on the order of GΩ. The resistances through single cross-point junctions between two PANI fibers were very much dependent on the experimental condition, that is, the cross-point junction is stabilized or destabilized by physically placing the probes onto the two fibers. This suggests the nanomechanical instability of the cross-point junctions and a possibility to construct strain-responsive PANI fiber networks.