Abstract
SummarySorghum genotypes known to be resistant or susceptible to shoot fly, Atherigona soccata Rondani were examined by scanning electron microscopy for differences in epicuticular wax structure and wetness of the central leaf whorl. Two major types of wax structures were observed: shoot fly resistant and moderately resistant genotypes were characterised by a smooth amorphous wax layer and sparse wax crystals while susceptible genotypes possessed a dense meshwork of crystalline epicuticular wax. The density of wax crystals decreased from the third leaf to the seventh leaf stage and was related to both seedling age and leaf position. Water droplets on susceptible genotypes with dense wax crystals showed spreading at the edges indicating a tendency to wet easily. In resistant genotypes with less dense wax crystals the droplets remained intact and did not spread.
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